Ms. Xiaopei Gao received her Master’s degree in Metrology from the Institute of Science and Technical Information of China. She has an in-depth understanding of the technological development in the fields of semiconductors, the Internet, information technology, and medical devices, etc. She also pays attention to the latest achievements of frontier technologies such as artificial intelligence, self-driving technology, wearable devices, 3D printing, and LBS. In Metis IP, Ms. Gao is mainly in charge of patent analysis, technical assessment, investigation and research work on account of her solid statistical analysis capability. She also has rich experience in PCT and U.S. patent applications, patent mining and patent portfolio. She often engages in the research and analysis of patent-related legal issues as well.